There exists a vast array of instrumentation available to both researcher and student including scanning electron microscope (SEM), field-emission SEM (FESEM), atomic force microscope (AFM), scanning tunneling microscope (STM), sputter and evaporative coaters, optical microscopes, dynamic light scattering (DLS), and many more. If you wish to use any of these instruments you must first contact the department and fill out the appropriate user agreement and attend training before attempting any sample characterization.

Please contact Lester Lampert at lampertl@uwplatt.edu with questions.

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